In the case of systems with layer-by-layer atomic
structure (and composition), it is very important to understand how the
electronic structure changes from layer to layer. This also applies to the case
of pure silicon, with the surface that undergoes structural restructuring. To
clarify this issue, we performed calculations, layer-by-layer, local densities
of electronic states (LDOS). In order not to clutter the paper with many
similar results, we limited ourselves to pure silicon with the Si (100)-p (2×2)
surface and systems of 1 and 2 ML Li on Si (100). The first case is interesting
due to the presence of dimers on the silicon surface, which leads to a band gap
significantly smaller than in bulk silicon; the second case demonstrates a
sharp increase in the Egap width and its sharp disappearance. Local densities
of states for pure silicon with the Si (100)-p (2×2) surface are shown in
(Figure 7).
This figure shows that in the LDOS corresponding to
the top layer, the band gap has a small width (0.54 eV) and is limited on both
sides by high peaks of occupied and unoccupied states. Next, we see that
gradually, from layer to layer, the relative intensities of the nearby free
states, marked by arrows, decrease and go to zero towards the last layer,
thereby opening an approximately twice wider gap (?1.0 eV), satisfactorily
corresponding to the value of Egap in bulk silicon (1.12 eV) (Figure 8). Shows
the LDOS for systems of 1 and 2 monolayers of Li on Si (100). This figure shows
that in the case of 1 ML Li coating (A panels) densities of states near the
Fermi level are very similar in the top, middle and bottom of the silicon slab,
and the band gap remains practically the same everywhere. On contrary, 2 ML Li
coating (B panels) leads to disappearing of the band gap, and metal-induced
unoccupied states present at the Fermi level up to the bottom of the silicon
slab.